News - Recently updated info
Sponsored by
CFE 2019 Special Invited Sessions
  • CI018: Stationarity and causality of time series
    Organizers: Josu Arteche
    Morten Nielsen, Queen's University, Canada.
    Uwe Hassler, Goethe University Frankfurt, Germany.
    Carlos Velasco, Universidad Carlos III de Madrid, Spain.
  • CI020: Invited Session 2
    Organizers: Walter Distaso
    Valentina Corradi, University of Surrey, United Kingdom.
    Marcelo Fernandes, Sao Paulo School of Economics, FGV, Brazil.
    Massimiliano Caporin, University of Padova, Italy.
  • CI022: Advances in financial econometrics
    Organizers: Roxana Halbleib
    Eric Renault, University of Warwick, United Kingdom.
    Roman Liesenfeld, University of Cologne, Germany.
    Joachim Grammig, Eberhard Karls Universitaet Tuebingen, Germany.
  • CI024: Econometrics of volatility
    Organizers: Mathieu Rosenbaum
    Nour Meddahi, Toulouse School of Economics, France.
    Mark Podolskij, Aarhus University, Denmark.
    Mathieu Rosenbaum, Ecole Polytechnique, France.
  • CI845: Advances in forecasting
    Organizers: Michael Owyang
    Michael Owyang, Federal Reserve Bank of St Louis, United States.
    Ana Galvao, University of Warwick, United Kingdom.
    Michael McCracken, Federal Reserve Bank of St. Louis, United States.
CMStatistics 2019 Special Invited Sessions
  • EI008: Directions in statistical modelling
    Organizers: Jochen Einbeck
    Matthieu Marbac, CREST - ENSAI, France.
    Christian Hennig, University of Bologna, Italy.
  • EI010: Sensitivity analysis for uncheckable assumptions
    Organizers: Michael Daniels
    Gianluca Baio, University College London, United Kingdom.
    Xavier de Luna, Umea University, Sweden.
    Fabrizia Mealli, University of Florence, Italy.
  • EI012: Statistical analysis of networks
    Organizers: Chenlei Leng
    Eric Kolaczyk, Boston University, United States.
    Ji Zhu, University of Michigan, United States.
    Karl Rohe, University of Wisconsin-Madison, United States.
  • EI014: Depth, ensembles and inference
    Organizers: Peter Rousseeuw
    Yiyuan She, Florida State University, United States.
    Maria-Pia Victoria-Feser, University of Geneva, Switzerland.
    Stefan Van Aelst, University of Leuven, Belgium.
  • EI016: Measurement error models and beyond
    Organizers: Grace Yi
    Jeff Buzas, The University of Vermont, United States.
    Grace Yi, University of Western Ontario, Canada.
    Liqun Wang, University of Manitoba, Canada.